Edge-On Ion Irradiation of Electron Microscope Specimens

Ion irradiation effects on graphite with scanning tunneling microscope

cellular behavior and scanning electron microscope evaluation of pro-root mta, root mta and modified mta on fibroblast l929

چکیده ندارد.

Electron imaging of dielectrics under simultaneous electron–ion irradiation

We demonstrate that if charging caused by electron irradiation of an insulator is controlled by a defocused flux of soft-landing positive ions, secondary electron ~SE! images can contain contrast due to lateral variations in ~i! changes in the SE yield caused by subsurface trapped charge and ~ii! the SE-ion recombination rate. Both contrast mechanisms can provide information on microscopic vari...

Development of a secondary-electron ion-microscope for microbeam diagnostics

We describe a novel secondary-electron ion microscope (SEIM), designed for diagnostics of the upcoming submicron Columbia University charged-particle microbeam. This secondary-electron ion microscope allows much higher resolutions, at higher single particle detection efficiencies, than previously available, for rapid and accurate diagnostics of sub-micron charged-particle beams. Based on ion el...

Prevalence Of Various Kinds Of Glumerulonephritis Based On The Electron Microscope Findings

  Background and Objective: Glumerular diseases are among the most prevalent causes of renal chronic insufficiencies. This study aimed to analyze the prevalence of various kinds of glumerulonephritis based on the findings of electron microscope. Materials and Methods: This study had a descriptive retrospective and cross sectional strategy. Slides of patients (124 cases) who had undergone kidn...